| Optical comparator (profile projector) | Projects a magnified silhouette of a part onto a screen. The operator compares the profile with a screen reticle or measures coordinates and angles. | External profiles, radii, angles, distances, and contour features. | Checking small machined parts, formed components, and two-dimensional outlines. | Provides a clear, enlarged view and is straightforward for profile comparisons. | Primarily measures projected two-dimensional features; results depend on setup, focus, and operator interpretation. |
| Measuring microscope | Uses magnified optics with a calibrated stage, reticle, or digital coordinate system to locate and measure visible features. | Small distances, hole spacing, edge positions, and fine surface details. | Small components and features that require magnification with dimensional measurement. | Combines detailed visual inspection with precise positioning of small features. | Field of view is limited at higher magnification; measurements generally require a stable, well-focused setup. |
| Video measuring system (vision measuring machine) | A camera captures the part, while software detects edges or other features and calculates dimensions from calibrated image coordinates. | Lengths, diameters, hole positions, angles, and two-dimensional geometric relationships. | Repeatable inspection of small or flat parts with multiple measurable features. | Automates image-based measurements and can store inspection routines for repeated jobs. | Accuracy can be affected by lighting, edge contrast, focus, calibration, and part orientation; hidden or steep features may be difficult to measure. |
| Stereo microscope | Two optical paths provide a three-dimensional perception of the sample at relatively low magnification. | Visible defects, assembly conditions, surface features, and general shape. | Hands-on inspection, sorting, rework, and examination of larger components. | Offers depth perception and a generous working distance for manipulating samples. | Usually supports visual assessment rather than calibrated, high-accuracy dimensional measurement. |
| Digital microscope | A camera and lens display a magnified image on a monitor; some systems add measurement, image capture, and focus-stacking functions. | Surface defects, feature dimensions within the calibrated image plane, and documented visual evidence. | Inspection and documentation where shared screen viewing or image records are useful. | Images are easy to capture, share, and annotate; some models provide on-screen measurement tools. | Measurement reliability depends on calibration, optics, focus, and viewing geometry; a two-dimensional image may not show true depth. |
| Confocal microscope | Rejects out-of-focus light using a spatial aperture and builds optical sections at different focal depths. | Surface topography, height differences, roughness-related characteristics, and structures with some depth variation. | Microscopic surface analysis when optical sectioning or height information is required. | Can generate depth-resolved surface data without physically touching the sample. | Results depend on reflectivity, surface shape, setup, and the instrument's measurement range; acquisition can be slower than broad-area imaging. |
| Optical interferometer | Combines light reflected from a reference path and a test surface. The resulting interference pattern is analyzed to calculate surface shape or displacement. | Surface flatness, step height, and microscopic surface form, depending on the instrument configuration. | Precision evaluation of smooth, reflective surfaces and small height variations. | Can measure very small surface-height differences without contact. | Vibration, surface reflectivity, steep slopes, and environmental conditions can affect measurement quality. |
| Automated optical inspection (AOI) system | One or more cameras capture images under controlled illumination; software compares features with programmed rules or reference data. | Presence or absence, placement, orientation, visible defects, and selected dimensional characteristics. | High-throughput inspection of repeated products, including electronic assemblies and manufactured components. | Supports fast, consistent inspection and automatic recording or rejection decisions. | Detects only features that are visible under the chosen optics and lighting; false calls and missed defects can occur if programs are poorly tuned. |